AI RESEARCH
Improving Combined Detection and Classification of TEM Defects via Mask-Conditioned Latent Diffusion Augmentation
arXiv CS.CV
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ArXi:2606.02532v1 Announce Type: new Analyzing microstructural defects in transmission electron microscopy (TEM) images, particularly in irradiated metal alloys, is often limited by the availability of high-quality, labeled data. To address this, we